• DocumentCode
    602347
  • Title

    Pad bending improvement on copper wire bonding on NiP/Pd/Au bond pad

  • Author

    Heong, Tan Kian ; Kim, Teo Chen ; Yong, Wang Mei

  • Author_Institution
    Infineon Technologies (Malaysia) Sdn. Bhd, Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Due to the high gold price, conversion from gold wire to copper wire has been a widely accepted method in semiconductor assembly for cost reduction. However, conversion from gold wire to copper wire is not a straight forward conversion. Copper wire is about 30% harder than gold wire and the commonly used bond pad metallization is Aluminium base (which is softer compare with Copper). Potential challenges include pad cratering, Al splash, lifted ball and reliability concern. Therefore, harder bond pad (plated on top of Aluminium) with Nickel as the base material was introduced. Ni which is harder than Cu, offer protection to the underlying structure, especially for probe and bond over active area products (XoAA).
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh, Perak, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521762
  • Filename
    6521762