DocumentCode :
602353
Title :
Development of advanced fan-out wafer level package (embedded wafer level BGA)
Author :
Yonggang Jin ; Teysseyre, Jerome ; Liu, Anandan Ramasy Yun ; Goh, G. ; Yoon, Sang Won
Author_Institution :
STMicroelectron., Singapore, Singapore
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
6
Abstract :
With reducing of silicon techno, the pitches and pads at the chip to package interface become important factor. This drives interconnection toward to fan-out packaging, where the package size is larger than the chip size in order to provide a sufficient area to accommodate the 2nd level interconnects. Fan-out WLP has the potential to realize any number of interconnects at any shrink stage of the wafer node technology.
Keywords :
chip scale packaging; interconnections; wafer level packaging; 2nd level interconnects; advanced fan-out wafer level package; chip to package interface; drives interconnection; embedded wafer level BGA; fan-out packaging; shrink stage; wafer node technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521783
Filename :
6521783
Link To Document :
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