DocumentCode :
602372
Title :
Selective rescreen
Author :
Kok, L.
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
7
Abstract :
In this technical paper, we discussed about the deployment of the selective rescreen features in Texas Instruments Malaysia´s final test operation flow. This includes the explanation on why the selective rescreen is critical and needed at TI´s final test operation, what are the benefits and positive impacts toward TI´s cost savings and productivity. Meantime, the paper also reflects the previous final test operation flow without the selective rescreen features and its production outcomes in terms of the cycle time and cost savings which directly affects the productivity. The paper also explicates the technical aspects of the implementation procedures and methodology of the selective rescreen based on the past and current production data over a series of analytical study. The last section of this technical paper provides the comparison of the outcome of the final test operation flow between before and after implementing the selective rescreen in terms of the material delivery cycles time, cost savings, quality as well as the production thruput.
Keywords :
integrated circuit manufacture; integrated circuit testing; cost savings; final test operation flow; material delivery cycle time; production data; production throughput; selective rescreen;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521817
Filename :
6521817
Link To Document :
بازگشت