DocumentCode :
602813
Title :
Limits and improvements of TCAD piezoresistive models in FDSOI transistors
Author :
Nier, O. ; Rideau, D. ; Clerc, R. ; Barbe, J.C. ; Silvestri, L. ; Nallet, F. ; Tavernier, C. ; Jaouen, H.
Author_Institution :
STMicroelectron., Crolles, France
fYear :
2013
fDate :
19-21 March 2013
Firstpage :
61
Lastpage :
64
Abstract :
The usefulness for technology computer-aided design (TCAD) tools of the bulk linear piezoresistive theory is limited for two reasons. The first is that the normal effective field breaks piezoresistive tensor symmetries increasing the number of independent coefficients from three to six. The second reason is due to the non-linear behavior of the mobility change at high stress values. In this paper, we investigated the six-order polynomial piezoresistive model recently published by Synopsys (MCmob) [16,17]. We demonstrated that a 3D k-space Monte-Carlo solver cannot be used for MCmob parameters calibration (as initially proposed in [16]) as it does not account for quantum confinement. Instead, using self-consistent k.p Poisson-Schrodinger solvers (Kubo-2Dk Greenwood formalism [14, 15] for mobility), we determined a set of parameters for MCmob in the case of p-type FDSOI MOSFETs with <;100> and <;110>-oriented silicon channels on (100)-oriented wafers.
Keywords :
MOSFET; Monte Carlo methods; calibration; elemental semiconductors; piezoresistive devices; polynomials; silicon; silicon-on-insulator; stochastic processes; technology CAD (electronics); tensors; 3D k-space Monte-Carlo solver; Kubo-2Dk Greenwood formalism; MCmob parameter calibration; Si; Synopsys publishing; TCAD piezoresistive model; bulk linear piezoresistive theory; p-type FDSOI MOSFET; piezoresistive tensor symmetry; quantum confinement; self-consistent k.p Poisson-Schrodinger solver; six-order polynomial piezoresistive model; technology computer-aided design; Calibration; Couplings; MOSFET; MOSFET circuits; Monte Carlo methods; Silicon; Three-dimensional displays; FDSOI; Strain; TCAD; non-linear piezoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
Conference_Location :
Coventry
Print_ISBN :
978-1-4673-4800-3
Electronic_ISBN :
978-1-4673-4801-0
Type :
conf
DOI :
10.1109/ULIS.2013.6523491
Filename :
6523491
Link To Document :
بازگشت