• DocumentCode
    602813
  • Title

    Limits and improvements of TCAD piezoresistive models in FDSOI transistors

  • Author

    Nier, O. ; Rideau, D. ; Clerc, R. ; Barbe, J.C. ; Silvestri, L. ; Nallet, F. ; Tavernier, C. ; Jaouen, H.

  • Author_Institution
    STMicroelectron., Crolles, France
  • fYear
    2013
  • fDate
    19-21 March 2013
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    The usefulness for technology computer-aided design (TCAD) tools of the bulk linear piezoresistive theory is limited for two reasons. The first is that the normal effective field breaks piezoresistive tensor symmetries increasing the number of independent coefficients from three to six. The second reason is due to the non-linear behavior of the mobility change at high stress values. In this paper, we investigated the six-order polynomial piezoresistive model recently published by Synopsys (MCmob) [16,17]. We demonstrated that a 3D k-space Monte-Carlo solver cannot be used for MCmob parameters calibration (as initially proposed in [16]) as it does not account for quantum confinement. Instead, using self-consistent k.p Poisson-Schrodinger solvers (Kubo-2Dk Greenwood formalism [14, 15] for mobility), we determined a set of parameters for MCmob in the case of p-type FDSOI MOSFETs with <;100> and <;110>-oriented silicon channels on (100)-oriented wafers.
  • Keywords
    MOSFET; Monte Carlo methods; calibration; elemental semiconductors; piezoresistive devices; polynomials; silicon; silicon-on-insulator; stochastic processes; technology CAD (electronics); tensors; 3D k-space Monte-Carlo solver; Kubo-2Dk Greenwood formalism; MCmob parameter calibration; Si; Synopsys publishing; TCAD piezoresistive model; bulk linear piezoresistive theory; p-type FDSOI MOSFET; piezoresistive tensor symmetry; quantum confinement; self-consistent k.p Poisson-Schrodinger solver; six-order polynomial piezoresistive model; technology computer-aided design; Calibration; Couplings; MOSFET; MOSFET circuits; Monte Carlo methods; Silicon; Three-dimensional displays; FDSOI; Strain; TCAD; non-linear piezoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
  • Conference_Location
    Coventry
  • Print_ISBN
    978-1-4673-4800-3
  • Electronic_ISBN
    978-1-4673-4801-0
  • Type

    conf

  • DOI
    10.1109/ULIS.2013.6523491
  • Filename
    6523491