• DocumentCode
    602830
  • Title

    Experimental evidence for a quantum wire state in HfO2-based VCM-RRAM

  • Author

    Xiaojuan Lian ; Miranda, E. ; Shibing Long ; Perniola, L. ; Ming Liu ; Sune, Jordi

  • Author_Institution
    Dept. d´Eng. Electron., Univ. Autonoma de Barcelona, Bellaterra, Spain
  • fYear
    2013
  • fDate
    19-21 March 2013
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    We study the reset transition in Pt/HfO2/Pt RRAM structures showing filamentary resistive switching (RS). Using various electrical reset methodologies we reveal three-state RS phenomena. Between the LRS and the HRS, a rather stable intermediate state is revealed and shown to have the properties of a quantum wire (QW). This QW state is characterized by having conductance of the order of G0~2e2 and represents a natural boundary between two different electron transport regimes. Above the G0 limit, the conduction is associated to extended quantum transport states which connect the two electrodes, while below it, a spatial gap is opened in the conducting filament (CF) and the conduction is controlled by hopping or tunneling. Analysis of the statistics of conductance during the reset experiments strongly support the existence of these three states and help understanding the evolution of the CF structure during RS.
  • Keywords
    electron transport theory; hafnium compounds; platinum; random-access storage; semiconductor quantum wires; statistical analysis; CF; HRS; LRS; Pt-HfO2-Pt; QW state; VCM-RRAM; conductance statistics analysis; conducting filament; electrical reset methodologies; electron transport regimes; filamentary RS; filamentary resistive switching; quantum wire state; three-state RS phenomena; Hafnium compounds; Materials; Sun; Switches; RRAM; non-voltatile memories; quantum wire; resistive switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
  • Conference_Location
    Coventry
  • Print_ISBN
    978-1-4673-4800-3
  • Electronic_ISBN
    978-1-4673-4801-0
  • Type

    conf

  • DOI
    10.1109/ULIS.2013.6523508
  • Filename
    6523508