DocumentCode :
602839
Title :
Mechanical resonators on CMOS for integrated passive band pass filters
Author :
Kazmi, S.N.R. ; Salm, C. ; Schmitz, Jurriaan
Author_Institution :
MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
fYear :
2013
fDate :
19-21 March 2013
Firstpage :
193
Lastpage :
196
Abstract :
We present CMOS post-processing compatible resonator structures for passive band-pass filtering in the MHz-few GHz range. This article discusses the considerations leading to the choice of materials and process sequence, practical aspects in the fabrication, and resonator performance. Using in-situ boron-doped polycrystalline germanium-silicon as resonator and electrode material, high quality factors over 200,000 are obtained at relatively low motional impedance.
Keywords :
CMOS integrated circuits; band-pass filters; boron; electrochemical electrodes; germanium compounds; passive filters; resonator filters; CMOS post-processing; GeSi:B; boron-doped polycrystalline germanium-silicon; electrode material; integrated passive band pass filter; mechanical resonator structure; motional impedance; quality factor; CMOS integrated circuits; Geology; Imaging; Lithography; Resistance; Resonant frequency; CMOS; GeSi; Lamé mode; MEMS; SiGe; above-IC; filter; germanium; microtechnology; resonator; silicon; software defined radio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
Conference_Location :
Coventry
Print_ISBN :
978-1-4673-4800-3
Electronic_ISBN :
978-1-4673-4801-0
Type :
conf
DOI :
10.1109/ULIS.2013.6523517
Filename :
6523517
Link To Document :
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