• DocumentCode
    602840
  • Title

    Simulation methodology for 2D random network of CNTs field-effect transistors

  • Author

    Min-Kyu Joo ; Mouis, M. ; Gyu-Tae Kim ; Un Jeong Kim ; Ghibaudo, Gerard

  • Author_Institution
    IMEP-LAHC, Grenoble INP-MINATEC, Grenoble, France
  • fYear
    2013
  • fDate
    19-21 March 2013
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    Two-dimensional (2D) random networks of carbon nanotubes (RN-CNTs) were simulated with respect to various geometry factors and compared with experimental results. To determine the effective current-conducting pathway(s) in such complex RN-CNTs, we developed a methodology to find the optimal percolation paths with account for the conduction length (ld) of each CNT segment involved, for properties of the junction between CNTs and for series resistance (Rsd) at contacts. Moreover, to investigate linear and non-linear operation of RN-CNT FETs, SPICE circuit simulation was employed.
  • Keywords
    carbon nanotube field effect transistors; geometry; nanocontacts; percolation; 2D random network; C; CNT field-effect transistor; FET; SPICE circuit simulation; carbon nanotube; conduction length; contact; current-conducting pathway; geometry; optimal percolation path; series resistance; simulation methodology; two-dimensional random network; Biological system modeling; Educational institutions; Field effect transistors; Gold; Immune system; Logic gates; Reliability; Carbon nanotube (CNT); SPICE simulation; percolation theory; sensor applications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2013 14th International Conference on
  • Conference_Location
    Coventry
  • Print_ISBN
    978-1-4673-4800-3
  • Electronic_ISBN
    978-1-4673-4801-0
  • Type

    conf

  • DOI
    10.1109/ULIS.2013.6523518
  • Filename
    6523518