• DocumentCode
    602887
  • Title

    Temperature aware thread migration in 3D architecture with stacked DRAM

  • Author

    Dali Zhao ; Homayoun, Houman ; Veidenbaum, A.V.

  • Author_Institution
    Univ. of California, Irvine, Irvine, CA, USA
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    80
  • Lastpage
    87
  • Abstract
    A 3D architecture with DRAM memory stacked on a multi-core processor has many benefits for the embedded system. Compared with a conventional 2D design, it reduces memory access latency, increases memory bandwidth and reduces energy consumption. However it poses a thermal challenge as the heat generated by the processor cannot dissipate efficiently through the DRAM memory layer. Due to the fact that DRAM is very sensitive to high temperature as well as temperature variance, 3D stacking causes more failures to occur because DRAM thermal variance is higher than the conventional 2D architecture. To address this thermal challenge we propose to reduce temperature variance and peak temperature of a 3D multi-core processor and stacked DRAM by thermally aware thread migration among processor cores. This method has very limited impact on processor performance. Using migration-based policy we reduce peak steady-state temperature in the processor by up to 8.3 degrees Celsius, with the average of 4.7 degrees.
  • Keywords
    DRAM chips; embedded systems; multiprocessing systems; three-dimensional integrated circuits; 2D architecture; 2D design; 3D architecture; 3D multicore processor; 3D stacking; DRAM memory layer; DRAM thermal variance; embedded system; energy consumption; memory access latency; memory bandwidth; migration based policy; processor core; stacked DRAM memory; steady state temperature; temperature aware thread migration; temperature variance; Context; Heuristic algorithms; Multicore processing; Random access memory; Temperature sensors; Three-dimensional displays; 3D architecture; Thermal Management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523594
  • Filename
    6523594