DocumentCode :
602900
Title :
Accurate architecture-level thermal analysis methods for MPSoC with consideration for leakage power dependence on temperature
Author :
Yan Jiaqi ; Luo Zuying ; Tang Liang
Author_Institution :
Beijing Normal Univ., Beijing, China
fYear :
2013
fDate :
4-6 March 2013
Firstpage :
178
Lastpage :
183
Abstract :
Efficient thermal analysis plays a key role in the temperature-aware floorplan design for MultiProcessor System-on-Chip (MPSoC) and Dynamic Power& Temperature Management (DPTM). This work adopts the bottom-up modeling method to study architecture-level MPSoC thermal analysis. First, it extracts relative thermal resistance between functional modules with HotSpot software. Then, based on these parameters, this work further proposes three analysis methods with different accuracy and algorithm complexity: Block-level Temperature Analysis Method (BloTAM), Core-level Temperature Analysis Method (CorTAM) and Block-Improving Core Temperature Analysis Method (BiCorTAM). Experiments show that BloTAM and BiCorTAM can substantially reduce the time for MPSoC thermal analysis with the high accuracy. Compared with HotSpot, both methods achieve 50+ times speedup in analysis with average temperature error as low as 3%. They are ideal architecture-level thermal analysis method for MPSoCs.
Keywords :
integrated circuit layout; integrated circuit modelling; multiprocessing systems; system-on-chip; thermal analysis; thermal resistance; BiCorTAM; BloTAM; DPTM; HotSpot software; MPSoC; architecture-level thermal analysis; block improving core temperature analysis method; block level temperature analysis method; bottom-up modeling; core level temperature analysis method; dynamic power and temperature management; functional modules; leakage power; multiprocessor system-on-chip; relative thermal resistance; temperature-aware floorplan design; Accuracy; Analytical models; Complexity theory; Heating; Multicore processing; Thermal analysis; Thermal resistance; Architecture-level; MPSoC; Modeling; Thermal Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-4951-2
Type :
conf
DOI :
10.1109/ISQED.2013.6523607
Filename :
6523607
Link To Document :
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