DocumentCode :
602910
Title :
Crosstalk timing windows overlap in statistical static timing analysis
Author :
Fatemi, H. ; Tehrani, P.
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
fYear :
2013
fDate :
4-6 March 2013
Firstpage :
245
Lastpage :
251
Abstract :
Process variation can have significant impact on device and interconnect performance, especially in the presence of crosstalk. A key technique to reduce crosstalk analysis pessimism is to consider timing window overlap of electrically coupled signals. SSTA timing windows tend to be larger than their corner counterparts resulting in pessimistic timing window overlap analysis, hence overestimating crosstalk impact. This paper describes an efficient method to remove die-to-die as well as common portion of within-die pessimism of the timing window overlap analysis. This approach has been implemented in an industrial timing analysis tool and experimental results show significant accuracy improvement and pessimism reduction compared to the existing techniques.
Keywords :
crosstalk; integrated circuit interconnections; statistical analysis; timing circuits; SSTA timing windows; crosstalk analysis pessimism; crosstalk impact; crosstalk timing windows overlap; device performance; electrically coupled signals; industrial timing analysis tool; interconnect performance; pessimistic timing window overlap analysis; process variation; statistical static timing analysis; within-die pessimism; Correlation; Crosstalk; Delays; Equations; Mathematical model; Random variables;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-4951-2
Type :
conf
DOI :
10.1109/ISQED.2013.6523617
Filename :
6523617
Link To Document :
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