DocumentCode
602980
Title
Analysis and comparison of XOR cell structures for low voltage circuit design
Author
Nishizawa, Shinichi ; Ishihara, Takuya ; Onodera, Hidetoshi
Author_Institution
Grad. Sch. of Inf., Kyoto Univ., Kyoto, Japan
fYear
2013
fDate
4-6 March 2013
Firstpage
703
Lastpage
708
Abstract
The performance of standard cells has a strong impact on the performance of a circuit synthesized with the cells. Although a complementary CMOS logic is usually used in the standard cells, it is known that a pass transistor logic can improve the performance of a circuit with a smaller area in some cases. We evaluate different types of XOR cells in different voltage conditions. Results show that the dual pass transistor XOR has a better performance than the complementary CMOS XOR in 0.6V operation, while the complementary CMOS XOR has a better performance in 1.2 V operation. More specifically, the area and the power consumption of a benchmark circuit composed of the dual pass transistor XOR can be reduced by 24% and 35%, respectively, compared to those of the same circuit composed of the complementary CMOS XOR in 0.6V operation.
Keywords
CMOS logic circuits; benchmark testing; integrated circuit design; low-power electronics; XOR cell structures; benchmark circuit; complementary CMOS logic; dual pass transistor XOR; low voltage circuit design; pass transistor logic; power consumption; standard cells; voltage 1.2 V; CMOS integrated circuits; Delays; Inverters; Libraries; Logic gates; Standards; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-4673-4951-2
Type
conf
DOI
10.1109/ISQED.2013.6523687
Filename
6523687
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