Title :
Experimental Verification of Conductor Loss Model for Thin Film Microstrip Line
Author :
Bansal, Rajeev ; Singh, Prashant ; Verma, Anil Kumar
Author_Institution :
South Campus, Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
Abstract :
This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.
Keywords :
conductors (electric); microstrip lines; millimetre wave devices; thin film devices; conductor loss computation; conductor loss model; experimental verification; frequency 1 GHz to 100 GHz; thin film conductor; thin film microstrip line; Computational modeling; Conductivity; Conductors; Gold; Microstrip; Strips; Substrates; Conductivity; Conductor loss; Holloway & Kuester; MMIC and THz; Perturbation method; TFMS;
Conference_Titel :
Advanced Computing and Communication Technologies (ACCT), 2013 Third International Conference on
Conference_Location :
Rohtak
Print_ISBN :
978-1-4673-5965-8
DOI :
10.1109/ACCT.2013.52
