DocumentCode
603250
Title
Experimental Verification of Conductor Loss Model for Thin Film Microstrip Line
Author
Bansal, Rajeev ; Singh, Prashant ; Verma, Anil Kumar
Author_Institution
South Campus, Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
fYear
2013
fDate
6-7 April 2013
Firstpage
208
Lastpage
210
Abstract
This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.
Keywords
conductors (electric); microstrip lines; millimetre wave devices; thin film devices; conductor loss computation; conductor loss model; experimental verification; frequency 1 GHz to 100 GHz; thin film conductor; thin film microstrip line; Computational modeling; Conductivity; Conductors; Gold; Microstrip; Strips; Substrates; Conductivity; Conductor loss; Holloway & Kuester; MMIC and THz; Perturbation method; TFMS;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Computing and Communication Technologies (ACCT), 2013 Third International Conference on
Conference_Location
Rohtak
ISSN
2327-0632
Print_ISBN
978-1-4673-5965-8
Type
conf
DOI
10.1109/ACCT.2013.52
Filename
6524304
Link To Document