Title :
Accurate and High-Speed Asynchronous Network-on-Chip Simulation Using Physical Wire-Delay Information
Author :
Hanyu, Takahiro ; Watanabe, Yoshihiro ; Matsumoto, Akiyoshi
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Abstract :
A performance-evaluation simulator is a key tool for exploring appropriate asynchronous Network-on-Chip (NoC) architecture in early stage of LSI design. This paper presents a highly accurate performance-evaluation simulator with maintaining a short evaluation time for designing a high-performance asynchronous NoC. The use of a precise asynchronous-router circuit model, whose physical parameters such as wire delays as well as unit gate delays are preliminarily obtained using LSI CAD tool, makes it accurate to simulate asynchronous NoC systems. As a design example, multi-core asynchronous mesh-structured NoC systems are simulated by both the previous method and the proposed one whose results, such as latency and throughput, are validated with a highly precise transistor-level simulation result. As a result, the proposed simulator achieves almost the same accuracy as the corresponding gate-level simulators, while its simulation speed is one-thousand-times faster than that of the gate-level one at the packet injection rate of 30 (packets/μsec).
Keywords :
CAD; asynchronous circuits; circuit simulation; delay circuits; integrated circuit design; large scale integration; network-on-chip; performance evaluation; transistors; wires (electric); LSI CAD tool; LSI design; NoC; asynchronous-router circuit model; gate-level simulator; high-speed asynchronous network-on-chip simulation; multicore asynchronous mesh-structured NoC system; packet injection; performance-evaluation simulator; physical wire-delay information; transistor-level simulation result; unit gate delay; LSI CAD tool; asynchronous network-on-chip (NoC); computation time; network topology;
Conference_Titel :
Multiple-Valued Logic (ISMVL), 2013 IEEE 43rd International Symposium on
Conference_Location :
Toyama
Print_ISBN :
978-1-4673-6067-8
Electronic_ISBN :
0195-623X
DOI :
10.1109/ISMVL.2013.11