DocumentCode :
60400
Title :
Avalanche Current Waveform Estimated From Electroluminescence in InGaAs/InP SPADs
Author :
Acerbi, Fabio ; Tosi, Alberto ; Zappa, Franco
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Volume :
25
Issue :
18
fYear :
2013
fDate :
Sept.15, 2013
Firstpage :
1778
Lastpage :
1780
Abstract :
We demonstrated that the avalanche current waveform in InGaAs/InP single-photon avalanche diodes (SPADs) can be estimated from the measurement of the electroluminescence emitted by the SPAD itself. We simultaneously acquired and compared both optical and electrical waveforms and we extracted the dependence of avalanche current on electroluminescence, showing that the number of collected photons is almost proportional to the number of carriers flowing through the p-n junction, whereas the excess bias (that sets the electric field in the multiplication region when the avalanche is triggered) has a negligible impact. This non-invasive optical technique for estimating the avalanche current can be used when the electrical measurements of the SPAD current are not feasible.
Keywords :
III-V semiconductors; avalanche photodiodes; electroluminescence; indium compounds; InGaAs-InP; SPAD; avalanche current waveform; electric field; electroluminescence measurement; noninvasive optical technique; single photon avalanche diode; Current measurement; Electroluminescence; Indium gallium arsenide; Indium phosphide; Logic gates; Optical pulses; Photonics; Avalanche current; SPAD; electroluminescence; optical testing; single-photon avalanche diode;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2275008
Filename :
6570518
Link To Document :
بازگشت