DocumentCode
60400
Title
Avalanche Current Waveform Estimated From Electroluminescence in InGaAs/InP SPADs
Author
Acerbi, Fabio ; Tosi, Alberto ; Zappa, Franco
Author_Institution
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Volume
25
Issue
18
fYear
2013
fDate
Sept.15, 2013
Firstpage
1778
Lastpage
1780
Abstract
We demonstrated that the avalanche current waveform in InGaAs/InP single-photon avalanche diodes (SPADs) can be estimated from the measurement of the electroluminescence emitted by the SPAD itself. We simultaneously acquired and compared both optical and electrical waveforms and we extracted the dependence of avalanche current on electroluminescence, showing that the number of collected photons is almost proportional to the number of carriers flowing through the p-n junction, whereas the excess bias (that sets the electric field in the multiplication region when the avalanche is triggered) has a negligible impact. This non-invasive optical technique for estimating the avalanche current can be used when the electrical measurements of the SPAD current are not feasible.
Keywords
III-V semiconductors; avalanche photodiodes; electroluminescence; indium compounds; InGaAs-InP; SPAD; avalanche current waveform; electric field; electroluminescence measurement; noninvasive optical technique; single photon avalanche diode; Current measurement; Electroluminescence; Indium gallium arsenide; Indium phosphide; Logic gates; Optical pulses; Photonics; Avalanche current; SPAD; electroluminescence; optical testing; single-photon avalanche diode;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2275008
Filename
6570518
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