• DocumentCode
    60400
  • Title

    Avalanche Current Waveform Estimated From Electroluminescence in InGaAs/InP SPADs

  • Author

    Acerbi, Fabio ; Tosi, Alberto ; Zappa, Franco

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • Volume
    25
  • Issue
    18
  • fYear
    2013
  • fDate
    Sept.15, 2013
  • Firstpage
    1778
  • Lastpage
    1780
  • Abstract
    We demonstrated that the avalanche current waveform in InGaAs/InP single-photon avalanche diodes (SPADs) can be estimated from the measurement of the electroluminescence emitted by the SPAD itself. We simultaneously acquired and compared both optical and electrical waveforms and we extracted the dependence of avalanche current on electroluminescence, showing that the number of collected photons is almost proportional to the number of carriers flowing through the p-n junction, whereas the excess bias (that sets the electric field in the multiplication region when the avalanche is triggered) has a negligible impact. This non-invasive optical technique for estimating the avalanche current can be used when the electrical measurements of the SPAD current are not feasible.
  • Keywords
    III-V semiconductors; avalanche photodiodes; electroluminescence; indium compounds; InGaAs-InP; SPAD; avalanche current waveform; electric field; electroluminescence measurement; noninvasive optical technique; single photon avalanche diode; Current measurement; Electroluminescence; Indium gallium arsenide; Indium phosphide; Logic gates; Optical pulses; Photonics; Avalanche current; SPAD; electroluminescence; optical testing; single-photon avalanche diode;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2275008
  • Filename
    6570518