DocumentCode
604305
Title
Modeling of in-house CENELEC A-band PLC channel using Fritchman model and Baum-Welch algorithm
Author
Familua, A.D. ; Ling Cheng
Author_Institution
Sch. of Electr. & Inf. Eng., Univ. of the Witwatersrand, Johannesburg, South Africa
fYear
2013
fDate
24-27 March 2013
Firstpage
173
Lastpage
178
Abstract
One of the many challenges which power line communication (PLC) has to overcome is noise and disturbances. Amidst the four frequency bands classified by the European CENELEC standard, the A-band is the most noise susceptible characterized by noise sources consisting of various electrical appliances. This paper aims at modeling the noise and disturbances present on the in-house CENELEC A-band based on experimental measurement. The outputs are the channel models of the three major types of noise present on the PLC. These models are achieved through the use of Fritchman model, to depict the power line channel and evaluate the noise impairment caused by the different types of noise. The Baum-Welch algorithm is implemented for the Fritchman model parameter estimation through likelihood evaluation by computing the probabilities of three different noise observation sequences obtained from the experimental measurement. These channel models can then be used to evaluate and optimize coding and modulation schemes for PLC.
Keywords
carrier transmission on power lines; modulation coding; parameter estimation; Baum-Welch algorithm; European CENELEC standard; Fritchman model; PLC; coding scheme; electrical appliance; in-house CENELEC A-band PLC channel model; modulation scheme; noise impairment; noise observation sequence; noise sources; noise susceptible; power line channel; power line communication; Channel models; Hidden Markov models; Laboratories; Narrowband; Noise; Noise measurement; Power line communications; Baum-Welch Algorithm; CENELEC; Fritchman model; noise measurement; power line communications;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Line Communications and Its Applications (ISPLC), 2013 17th IEEE International Symposium on
Conference_Location
Johannesburg
Print_ISBN
978-1-4673-6014-2
Electronic_ISBN
978-1-4673-6015-9
Type
conf
DOI
10.1109/ISPLC.2013.6525845
Filename
6525845
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