DocumentCode
604653
Title
Studies on reliability of PVC-graphite thick film resistors
Author
Poornaiah, B. ; Rambabu, B. ; Subrahmanyam, K.V. ; SrinivasaRao, Y.
Author_Institution
Dept. of Instrum. Technol., Andhra Univ. Coll. of Eng., Visakhapatanam, India
fYear
2013
fDate
22-23 March 2013
Firstpage
483
Lastpage
485
Abstract
This investigation is undertaken to determine the reliability of PVC-graphite thick film resistors by determining the potential failure mechanism and the mean time - to - failure. Different drift functions are described for PVC-graphite thick film resistors with different PVC-graphite compositions. The values of the functional parameters depend strongly on the storage test temperature. The mean-to-failure of the PVC-graphite thick film resistors are calculated using Pranchov´s model for reliability prediction of thick film resistors.
Keywords
graphite; semiconductor device reliability; thick film resistors; C; PVC-graphite thick film resistor reliability prediction; Pranchov model; failure mechanism; mean time-to-failure; Equations; Graphite; Polymers; Reliability; Resistance; Resistors; Thick films; Polymer resistors; composition; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation, Computing, Communication, Control and Compressed Sensing (iMac4s), 2013 International Multi-Conference on
Conference_Location
Kottayam
Print_ISBN
978-1-4673-5089-1
Type
conf
DOI
10.1109/iMac4s.2013.6526460
Filename
6526460
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