• DocumentCode
    604731
  • Title

    Design and Analysis of a Robust, High Speed, Energy Efficient 18 Transistor 1-bit Full Adder Cell, Modified with the Concept of MVT Scheme

  • Author

    Basak, S. ; Saha, D. ; Mukherjee, Sayan ; Chatterjee, Saptarshi ; Sarkar, Chandan K.

  • Author_Institution
    Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
  • fYear
    2012
  • fDate
    19-22 Dec. 2012
  • Firstpage
    130
  • Lastpage
    134
  • Abstract
    Optimization of power and speed is the most crucial issue for any low-voltage, low-power design. In this paper an Energy Efficient, Robust 18 Transistor (18T) 1-bit Full Adder (FA) cell, modified with the concept of Mixed Threshold Voltage (MVT) scheme, is reported. The entire design is done in 45nm technology, and compared to the conventional one, a considerable amount of reduction in the Average Power consumption (Pavg) as well as the Power Delay Product (PDP) has been achieved. For an operating frequency of 500MHz, the Pavg is as low as 9.31×10-8 Watt, whereas the PDP for Sum output is found to be 1.115×10-18 Joule. The analyses have been carried out with help of the simulation runs on SPICE, and that indicate, for the lower Supply Voltages (Vdd), MVT scheme can be a more practical option than the simple dual threshold technique.
  • Keywords
    MOSFET; adders; low-power electronics; optimisation; MVT scheme; PDP; SPICE; frequency 500 MHz; full adder cell; low-power design; low-voltage design; mixed threshold voltage; optimization; power consumption; power delay product; robust transistor; size 45 nm; word length 1 bit; ALU; Dual Threshold Technique; Full Adder; High Speed; Leakage Current; Low-Power; MVT; PDP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System Design (ISED), 2012 International Symposium on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4673-4704-4
  • Type

    conf

  • DOI
    10.1109/ISED.2012.23
  • Filename
    6526568