Title :
Issues of finding a proper golden-reference sample for TIM tester calibration
Author :
Vass-Varnai, Andras ; Laky, S. ; Sarkany, Zoltan ; Barna, Cornel ; Rencz, Marta
Author_Institution :
Mech. Anal. Div., Mentor Graphics, Budapest, Hungary
Abstract :
In this paper we first describe a thermal interface material measurement methodology based on thermal transient testing. Measurement examples on different types of TIM materials are shown and guidelines are given, how the tests should be carried out to achieve the highest possible accuracy. Finally we give recommendations on what types of materials have proven for us to be the best candidates to be used in round-robin tests for the comparison of different test methodologies.
Keywords :
materials testing; thermal conductivity measurement; transient analysis; TIM tester calibration; golden-reference sample; round-robin tests; thermal interface material measurement methodology; thermal transient testing; Conductivity; Electrical resistance measurement; Materials; Temperature measurement; Thermal conductivity; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-6427-0
Electronic_ISBN :
1065-2221
DOI :
10.1109/SEMI-THERM.2013.6526829