DocumentCode
604881
Title
[Back cover]
fYear
2013
fDate
17-21 March 2013
Abstract
Presents the back cover of the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
978-1-4673-6427-0
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/SEMI-THERM.2013.6526841
Filename
6526841
Link To Document