DocumentCode
605054
Title
Influence of power semiconductor on-voltage on iron loss of inverter-fed
Author
Kyamoari, D. ; FUJISAKI, Keisuke
Author_Institution
Electromagn. Energy Syst. Lab., Toyota Technol. Inst., Nagoya, Japan
fYear
2013
fDate
22-25 April 2013
Firstpage
840
Lastpage
845
Abstract
The influence of power semiconductor on-voltage on iron loss of inverter-fed electrical steels is made clear through the experimental data. One-phase full bridge inverter is used for an iron loss evaluation, where Bipolar transistor, MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and IGBT (Insulated Gate Bipolar Transistor) are selected as power semiconductors in an inverter circuit. When maximum magnetic flux density is adjusted to be 1 [T] in the electrical steel, the measured iron loss is different from the three kinds of power semiconductors.
Keywords
bridge circuits; insulated gate bipolar transistors; invertors; iron; iron alloys; losses; power MOSFET; power bipolar transistors; power semiconductor devices; silicon alloys; FeSi; IGBT; MOSFET; bipolar transistor; electrical steel; insulated gate bipolar transistor; inverter circuit; inverter-fed electrical steels; iron loss evaluation; iron loss measurement; maximum magnetic flux density; metal-oxide-semiconductor field-effect transistor; one-phase full bridge inverter; power semiconductor on-voltage; Insulated gate bipolar transistors; Inverters; Iron; Magnetic flux density; Magnetic hysteresis; Semiconductor device measurement; Steel;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
Conference_Location
Kitakyushu
ISSN
2164-5256
Print_ISBN
978-1-4673-1790-0
Electronic_ISBN
2164-5256
Type
conf
DOI
10.1109/PEDS.2013.6527134
Filename
6527134
Link To Document