• DocumentCode
    605054
  • Title

    Influence of power semiconductor on-voltage on iron loss of inverter-fed

  • Author

    Kyamoari, D. ; FUJISAKI, Keisuke

  • Author_Institution
    Electromagn. Energy Syst. Lab., Toyota Technol. Inst., Nagoya, Japan
  • fYear
    2013
  • fDate
    22-25 April 2013
  • Firstpage
    840
  • Lastpage
    845
  • Abstract
    The influence of power semiconductor on-voltage on iron loss of inverter-fed electrical steels is made clear through the experimental data. One-phase full bridge inverter is used for an iron loss evaluation, where Bipolar transistor, MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and IGBT (Insulated Gate Bipolar Transistor) are selected as power semiconductors in an inverter circuit. When maximum magnetic flux density is adjusted to be 1 [T] in the electrical steel, the measured iron loss is different from the three kinds of power semiconductors.
  • Keywords
    bridge circuits; insulated gate bipolar transistors; invertors; iron; iron alloys; losses; power MOSFET; power bipolar transistors; power semiconductor devices; silicon alloys; FeSi; IGBT; MOSFET; bipolar transistor; electrical steel; insulated gate bipolar transistor; inverter circuit; inverter-fed electrical steels; iron loss evaluation; iron loss measurement; maximum magnetic flux density; metal-oxide-semiconductor field-effect transistor; one-phase full bridge inverter; power semiconductor on-voltage; Insulated gate bipolar transistors; Inverters; Iron; Magnetic flux density; Magnetic hysteresis; Semiconductor device measurement; Steel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
  • Conference_Location
    Kitakyushu
  • ISSN
    2164-5256
  • Print_ISBN
    978-1-4673-1790-0
  • Electronic_ISBN
    2164-5256
  • Type

    conf

  • DOI
    10.1109/PEDS.2013.6527134
  • Filename
    6527134