DocumentCode :
605130
Title :
Drive loss analysis and comparison of capacitor-less gate drive circuit for GaN FETs with capacitor type gate drive circuits
Author :
Hattori, Fumiya ; Umegami, Hirokatsu ; Yoshida, Takafumi ; Yamamoto, Manabu
Author_Institution :
Dept. of Electron. & Control Syst. Eng., Shimane Univ., Matsue, Japan
fYear :
2013
fDate :
22-25 April 2013
Firstpage :
1301
Lastpage :
1305
Abstract :
Galluim-Nitride(GaN) power devises have a potential to achieve higher efficiency operation than Silicon(Si) ones such as MOS FETs and IGBTs. However, the characteristic of GaN FETs is different from MOS FETs, and thus, there is the possibility that GaN-based power electronics circuits shows more losses than Si-based ones. To resolve this problem, some of the gate drive circuits for GaN FETs are proposed and one of them is called capacitor-less gate drive circuit. This paper presents drive losses analysis of the capacitor-less gate drive circuit. Furthermore, the drive losses of the capacitor-less gate drive circuit are compared with capacitor-type gate drive circuit experimentally.
Keywords :
III-V semiconductors; driver circuits; field effect transistors; gallium compounds; losses; power electronics; wide band gap semiconductors; GaN; IGBT; MOSFET; capacitor type gate drive circuits; capacitor-less gate drive circuit; drive loss analysis; power electronics circuits; Capacitors; Field effect transistors; Gallium nitride; Logic gates; Resistors; Switches; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
Conference_Location :
Kitakyushu
ISSN :
2164-5256
Print_ISBN :
978-1-4673-1790-0
Electronic_ISBN :
2164-5256
Type :
conf
DOI :
10.1109/PEDS.2013.6527220
Filename :
6527220
Link To Document :
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