• DocumentCode
    605130
  • Title

    Drive loss analysis and comparison of capacitor-less gate drive circuit for GaN FETs with capacitor type gate drive circuits

  • Author

    Hattori, Fumiya ; Umegami, Hirokatsu ; Yoshida, Takafumi ; Yamamoto, Manabu

  • Author_Institution
    Dept. of Electron. & Control Syst. Eng., Shimane Univ., Matsue, Japan
  • fYear
    2013
  • fDate
    22-25 April 2013
  • Firstpage
    1301
  • Lastpage
    1305
  • Abstract
    Galluim-Nitride(GaN) power devises have a potential to achieve higher efficiency operation than Silicon(Si) ones such as MOS FETs and IGBTs. However, the characteristic of GaN FETs is different from MOS FETs, and thus, there is the possibility that GaN-based power electronics circuits shows more losses than Si-based ones. To resolve this problem, some of the gate drive circuits for GaN FETs are proposed and one of them is called capacitor-less gate drive circuit. This paper presents drive losses analysis of the capacitor-less gate drive circuit. Furthermore, the drive losses of the capacitor-less gate drive circuit are compared with capacitor-type gate drive circuit experimentally.
  • Keywords
    III-V semiconductors; driver circuits; field effect transistors; gallium compounds; losses; power electronics; wide band gap semiconductors; GaN; IGBT; MOSFET; capacitor type gate drive circuits; capacitor-less gate drive circuit; drive loss analysis; power electronics circuits; Capacitors; Field effect transistors; Gallium nitride; Logic gates; Resistors; Switches; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
  • Conference_Location
    Kitakyushu
  • ISSN
    2164-5256
  • Print_ISBN
    978-1-4673-1790-0
  • Electronic_ISBN
    2164-5256
  • Type

    conf

  • DOI
    10.1109/PEDS.2013.6527220
  • Filename
    6527220