DocumentCode
605130
Title
Drive loss analysis and comparison of capacitor-less gate drive circuit for GaN FETs with capacitor type gate drive circuits
Author
Hattori, Fumiya ; Umegami, Hirokatsu ; Yoshida, Takafumi ; Yamamoto, Manabu
Author_Institution
Dept. of Electron. & Control Syst. Eng., Shimane Univ., Matsue, Japan
fYear
2013
fDate
22-25 April 2013
Firstpage
1301
Lastpage
1305
Abstract
Galluim-Nitride(GaN) power devises have a potential to achieve higher efficiency operation than Silicon(Si) ones such as MOS FETs and IGBTs. However, the characteristic of GaN FETs is different from MOS FETs, and thus, there is the possibility that GaN-based power electronics circuits shows more losses than Si-based ones. To resolve this problem, some of the gate drive circuits for GaN FETs are proposed and one of them is called capacitor-less gate drive circuit. This paper presents drive losses analysis of the capacitor-less gate drive circuit. Furthermore, the drive losses of the capacitor-less gate drive circuit are compared with capacitor-type gate drive circuit experimentally.
Keywords
III-V semiconductors; driver circuits; field effect transistors; gallium compounds; losses; power electronics; wide band gap semiconductors; GaN; IGBT; MOSFET; capacitor type gate drive circuits; capacitor-less gate drive circuit; drive loss analysis; power electronics circuits; Capacitors; Field effect transistors; Gallium nitride; Logic gates; Resistors; Switches; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
Conference_Location
Kitakyushu
ISSN
2164-5256
Print_ISBN
978-1-4673-1790-0
Electronic_ISBN
2164-5256
Type
conf
DOI
10.1109/PEDS.2013.6527220
Filename
6527220
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