• DocumentCode
    60525
  • Title

    Corrections to “Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester” [Jan 13 51-53]

  • Author

    Cho, Benjamin Youngjae ; Song, Seunghyun ; Ji, Yuefeng ; Choi, Ho-Gil ; Ko, Heung Cho ; Lee, Jhih-Shian ; Jung, Gun-Young ; Lee, Taewoo

  • Author_Institution
    School of Materials Science and Engineering, Department of Nanobio Materials and Electronics, Gwangju Institute of Science and Technology, Gwangju, Korea
  • Volume
    34
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    468
  • Lastpage
    468
  • Abstract
    In the above-named article [ibid., vol. 34, no. 1, pp. 51-53, Jan. 2013], the corresponding authors were not clearly specified. This correction is to indicate that Gun-Young Jung and Takhee Lee are the corresponding authors for the paper.
  • Keywords
    Integrated circuit testing; Nonvolatile memory; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2246375
  • Filename
    6464509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=60525