Title :
Corrections to “Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester” [Jan 13 51-53]
Author :
Cho, Benjamin Youngjae ; Song, Seunghyun ; Ji, Yuefeng ; Choi, Ho-Gil ; Ko, Heung Cho ; Lee, Jhih-Shian ; Jung, Gun-Young ; Lee, Taewoo
Author_Institution :
School of Materials Science and Engineering, Department of Nanobio Materials and Electronics, Gwangju Institute of Science and Technology, Gwangju, Korea
Abstract :
In the above-named article [ibid., vol. 34, no. 1, pp. 51-53, Jan. 2013], the corresponding authors were not clearly specified. This correction is to indicate that Gun-Young Jung and Takhee Lee are the corresponding authors for the paper.
Keywords :
Integrated circuit testing; Nonvolatile memory; Random access memory;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2013.2246375
