• DocumentCode
    605513
  • Title

    Characterisation and integration of Parylene as an insulating structural layer for high aspect ratio electroplated copper coils

  • Author

    Walker, Richard ; Sirotkin, E. ; Schmueser, I. ; Terry, J.G. ; Smith, Samuel ; Stevenson, J.T.M. ; Walton, A.J.

  • Author_Institution
    Scottish Microelectron. Centre, Univ. of Edinburgh, Edinburgh, UK
  • fYear
    2013
  • fDate
    25-28 March 2013
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    This paper reports the development of processing methods and test structures for the characterisation and evaluation of Parylene-C as an insulating structural layer material for integration with planar micro-inductors. The process involves the filling of high aspect ratio gaps between copper structures with Parylene and subsequent chemical mechanical planarisation. A test chip has been designed to characterise this process and the results presented. Subsequently complete micro-inductors, with magnetic cores, have been fabricated to demonstrate the capability of the process.
  • Keywords
    coils; copper; electroplating; polymers; high aspect ratio electroplated copper coils; insulating structural layer; parylene; planar microinductors; processing methods; Annealing; Coils; Copper; Films; Semiconductor device measurement; Strain; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
  • Conference_Location
    Osaka, Japan
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4673-4845-4
  • Electronic_ISBN
    1071-9032
  • Type

    conf

  • DOI
    10.1109/ICMTS.2013.6528137
  • Filename
    6528137