DocumentCode :
605513
Title :
Characterisation and integration of Parylene as an insulating structural layer for high aspect ratio electroplated copper coils
Author :
Walker, Richard ; Sirotkin, E. ; Schmueser, I. ; Terry, J.G. ; Smith, Samuel ; Stevenson, J.T.M. ; Walton, A.J.
Author_Institution :
Scottish Microelectron. Centre, Univ. of Edinburgh, Edinburgh, UK
fYear :
2013
fDate :
25-28 March 2013
Firstpage :
7
Lastpage :
12
Abstract :
This paper reports the development of processing methods and test structures for the characterisation and evaluation of Parylene-C as an insulating structural layer material for integration with planar micro-inductors. The process involves the filling of high aspect ratio gaps between copper structures with Parylene and subsequent chemical mechanical planarisation. A test chip has been designed to characterise this process and the results presented. Subsequently complete micro-inductors, with magnetic cores, have been fabricated to demonstrate the capability of the process.
Keywords :
coils; copper; electroplating; polymers; high aspect ratio electroplated copper coils; insulating structural layer; parylene; planar microinductors; processing methods; Annealing; Coils; Copper; Films; Semiconductor device measurement; Strain; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location :
Osaka, Japan
ISSN :
1071-9032
Print_ISBN :
978-1-4673-4845-4
Electronic_ISBN :
1071-9032
Type :
conf
DOI :
10.1109/ICMTS.2013.6528137
Filename :
6528137
Link To Document :
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