DocumentCode
605514
Title
Micromechanical test structures for the characterisation of electroplated NiFe cantilevers and their viability for use in MEMS switching devices
Author
Schiavone, Giuseppe ; Smith, Samuel ; Murray, Jacob ; Terry, J.G. ; Desmulliez, Marc Philippe Y. ; Walton, A.J.
Author_Institution
Scottish Microelectron. Centre, Univ. of Edinburgh, Edinburgh, UK
fYear
2013
fDate
25-28 March 2013
Firstpage
13
Lastpage
18
Abstract
This paper presents the fabrication of a series of test devices designed to prove the viability of electroplated NiFe freestanding structures for use in magnetically actuated MEMS switches. Preliminary results show promising actuation responses and further release optimisation and testing will enable the quantitative measurement of the desired characteristics. In addition, this will potentially enable the mechanical characterisation of freestanding structures in other materials by means of magnetic actuation, simply by depositing small quantities of NiFe or other magnetic materials in convenient areas of existing devices.
Keywords
electroplating; magnetic materials; microswitches; nickel compounds; MEMS switching devices; NiFe; actuation response; electroplated cantilevers; freestanding structures; magnetic actuation; magnetic materials; magnetically actuated MEMS switches; mnicromechanical test structures; test devices; Force; Magnetic devices; Magnetomechanical effects; Metals; Substrates; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location
Osaka, Japan
ISSN
1071-9032
Print_ISBN
978-1-4673-4845-4
Electronic_ISBN
1071-9032
Type
conf
DOI
10.1109/ICMTS.2013.6528138
Filename
6528138
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