DocumentCode :
605514
Title :
Micromechanical test structures for the characterisation of electroplated NiFe cantilevers and their viability for use in MEMS switching devices
Author :
Schiavone, Giuseppe ; Smith, Samuel ; Murray, Jacob ; Terry, J.G. ; Desmulliez, Marc Philippe Y. ; Walton, A.J.
Author_Institution :
Scottish Microelectron. Centre, Univ. of Edinburgh, Edinburgh, UK
fYear :
2013
fDate :
25-28 March 2013
Firstpage :
13
Lastpage :
18
Abstract :
This paper presents the fabrication of a series of test devices designed to prove the viability of electroplated NiFe freestanding structures for use in magnetically actuated MEMS switches. Preliminary results show promising actuation responses and further release optimisation and testing will enable the quantitative measurement of the desired characteristics. In addition, this will potentially enable the mechanical characterisation of freestanding structures in other materials by means of magnetic actuation, simply by depositing small quantities of NiFe or other magnetic materials in convenient areas of existing devices.
Keywords :
electroplating; magnetic materials; microswitches; nickel compounds; MEMS switching devices; NiFe; actuation response; electroplated cantilevers; freestanding structures; magnetic actuation; magnetic materials; magnetically actuated MEMS switches; mnicromechanical test structures; test devices; Force; Magnetic devices; Magnetomechanical effects; Metals; Substrates; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location :
Osaka, Japan
ISSN :
1071-9032
Print_ISBN :
978-1-4673-4845-4
Electronic_ISBN :
1071-9032
Type :
conf
DOI :
10.1109/ICMTS.2013.6528138
Filename :
6528138
Link To Document :
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