• DocumentCode
    605514
  • Title

    Micromechanical test structures for the characterisation of electroplated NiFe cantilevers and their viability for use in MEMS switching devices

  • Author

    Schiavone, Giuseppe ; Smith, Samuel ; Murray, Jacob ; Terry, J.G. ; Desmulliez, Marc Philippe Y. ; Walton, A.J.

  • Author_Institution
    Scottish Microelectron. Centre, Univ. of Edinburgh, Edinburgh, UK
  • fYear
    2013
  • fDate
    25-28 March 2013
  • Firstpage
    13
  • Lastpage
    18
  • Abstract
    This paper presents the fabrication of a series of test devices designed to prove the viability of electroplated NiFe freestanding structures for use in magnetically actuated MEMS switches. Preliminary results show promising actuation responses and further release optimisation and testing will enable the quantitative measurement of the desired characteristics. In addition, this will potentially enable the mechanical characterisation of freestanding structures in other materials by means of magnetic actuation, simply by depositing small quantities of NiFe or other magnetic materials in convenient areas of existing devices.
  • Keywords
    electroplating; magnetic materials; microswitches; nickel compounds; MEMS switching devices; NiFe; actuation response; electroplated cantilevers; freestanding structures; magnetic actuation; magnetic materials; magnetically actuated MEMS switches; mnicromechanical test structures; test devices; Force; Magnetic devices; Magnetomechanical effects; Metals; Substrates; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
  • Conference_Location
    Osaka, Japan
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4673-4845-4
  • Electronic_ISBN
    1071-9032
  • Type

    conf

  • DOI
    10.1109/ICMTS.2013.6528138
  • Filename
    6528138