DocumentCode :
605516
Title :
A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches
Author :
Barbato, Marco ; Giliberto, V. ; Meneghesso, Gaudenzio
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padua, Italy
fYear :
2013
fDate :
25-28 March 2013
Firstpage :
25
Lastpage :
30
Abstract :
In this work we present a new measurement set up able to predict the lifetime of packaged ohmic RF MEMS submitted to long actuation periods. Experimental results were carried out for a relatively long time period in order to verify the degradation law relates to charge trapping and stiction on cantilever and clamped-clamped switches. Thanks to the use of a microcontroller we have been able to reach a complete control of the timing during the stress phase. Furthermore, the characterization phase has been remarkably reduced in order to minimally influence the charge trapping during the characterization of stressed device. Results are carried out on two different MEMS designs (clamped-clamped and cantilever configurations).
Keywords :
cantilevers; microfabrication; microswitches; RF MEMS packaged switches; cantilever configurations; charge trapping phenomena; clamped-clamped switches; long actuation periods; measurement set-up; packaged ohmic RF MEMS; stiction; stress phase; Charge carrier processes; Fitting; Microcontrollers; Micromechanical devices; Radio frequency; Stress; Voltage measurement; charge trapping; long term actuation; ohmic RF MEMS; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location :
Osaka, Japan
ISSN :
1071-9032
Print_ISBN :
978-1-4673-4845-4
Electronic_ISBN :
1071-9032
Type :
conf
DOI :
10.1109/ICMTS.2013.6528140
Filename :
6528140
Link To Document :
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