Varying probability of droop fault depending on probabilistic nature of logic gates

A fault in VLSI logic may encourage to happen another fault in the circuit and may the circuit causes malfunctioning. But if a fault discourage another fault to happen that would be an interesting area of our concern. In this paper we have focused on the droop fault and probabilistic logic gates fault in the VLSI circuit and observe that probabilistic nature of the logic gates might sometime stop a droop fault to occur, without affecting the desired output of the circuit.