• DocumentCode
    60667
  • Title

    A Deterministic Digital Background Calibration Technique for VCO-Based ADCs

  • Author

    Sachin Rao ; Reddy, Karthikeyan ; Young, B. ; Hanumolu, Pavan Kumar

  • Author_Institution
    Qualcomm Technol., Santa Clara, CA, USA
  • Volume
    49
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    950
  • Lastpage
    960
  • Abstract
    This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator (VCO) based ADC. The distortion caused due to the VCO´s nonlinear tuning characteristics is eliminated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function using a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as operational amplifiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibration improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91-112 fJ/conv-step for different input frequencies.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; frequency locked loops; transfer functions; voltage-controlled oscillators; CMOS process; SNDR; analog to digital converter; bandwidth 5 MHz; calibration unit; deterministic digital background calibration technique; figure-of-merit; highly digital frequency locked loop; inverse voltage-to-frequency transfer function; linear voltage-controlled-oscillator; nonlinear tuning characteristics; on-chip calibration; open-loop VCO-based ADC; power 4.1 mW; scaling friendly properties; signal path; size 90 nm; Calibration; Clocks; Delays; Frequency conversion; Radiation detectors; Tuning; Voltage-controlled oscillators; Background calibration; VCO based ADC; calibration; deterministic calibration; open-loop delta sigma; time based ADC;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2293753
  • Filename
    6712154