• DocumentCode
    606837
  • Title

    The fracture studies of polycrystalline silicon based MEMS

  • Author

    Mulay, S.S. ; Becker, Gabriella ; Vayrette, R. ; Raskin, J. ; Pardoen, T. ; Galceran, M. ; Godet, S. ; Noels, L.

  • Author_Institution
    Dept. of Aerosp. & Mech. Eng., Univ. of Liege, Liege, Belgium
  • fYear
    2013
  • fDate
    14-17 April 2013
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The advantages of micro-electro-mechanical systems (MEMS), such as low power requirement, miniaturized sizes and costs reduction, have already made significant impact in many technological fields. MEMS are now widely used as accelerometers, pressure sensors, and resonators etc. However, the determination of the mechanical properties of MEMS devices with high accuracy is still a challenging task due to their small dimensions and often anisotropic behaviour. This paper focuses on the modelling and simulation of the fracture of a key MEMS component, which is a polycrystalline silicon beam, by discontinuous Galerkin (DG) formulation combined with an extrinsic cohesive law (ECL) to describe the fracture process. As the beam is modelled by plane-stress 2D elements, an analytical equation to compute the effective fracture strength and the effective critical strain energy release rate in terms of the through-the-thickness fracture mode and of the orientation of the facet with respect to the crystal is also developed. At the end, a model is simulated, and the results are verified as per the physics of the problem and experiments.
  • Keywords
    Galerkin method; accelerometers; mechanical properties; micromechanical devices; pressure sensors; resonators; MEMS; accelerometers; discontinuous Galerkin formulation; extrinsic cohesive law; fracture studies; mechanical properties; micro-electro-mechanical systems; plane-stress 2D elements; polycrystalline silicon; pressure sensors; resonators; Abstracts; Indium phosphide; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-1-4673-6138-5
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2013.6529898
  • Filename
    6529898