Title :
Protection Power device performance investigation using TCAD simulations
Author :
Roqueta, F. ; Tahri, K.
Author_Institution :
STMicroelectron., Tours, France
Abstract :
The paper presents a methodology for simulating the dynamic performances of a protection device used against EOS. Due to the coupling of electric and thermal phenomena occurring in the device during the EOS event, electro-thermal simulations are required. In order to obtain accurate description of the device behavior, component is simulated at different scales: 2D electrothermal simulation at device-scale and 3D thermal simulation at the package-scale. This approach allows to understand the behavior of the component and then to optimize it.
Keywords :
electrostatic discharge; technology CAD (electronics); 2D electrothermal simulation; 3D thermal simulation; TCAD simulation; device behavior; dynamic performance; electrical overstress; protection device; protection power device performance; Abstracts; Copper; Generators; Silicon; Surge protection; Surges; Welding;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-1-4673-6138-5
DOI :
10.1109/EuroSimE.2013.6529904