DocumentCode
606863
Title
Dealing with IC package material and design uncertainties using FUZZY finite elements
Author
Vandevelde, B. ; Konstantinou, Ioannis ; Moens, D. ; Vandepitte, D.
Author_Institution
Imec, Leuven, Belgium
fYear
2013
fDate
14-17 April 2013
Firstpage
1
Lastpage
7
Abstract
In this work, a new method is proposed using Fuzzy finite element modelling (FFEM) which is a non-probabilistic approach to deal with uncertainties. This method requires one order lower number of simulations than the more commonly used Monte Carlo approach to predict the distribution on the output variables. The method is demonstrated on a thermo-mechanical stress case study with overmould material properties as input variables (uncertainties) and the package warpage at reflow temperature and the die stress at minimum temperature as output variables. For three well-chosen input uncertainties, the distribution of the output variables are predicted using the FFEM method, based on a parameter set of only 15 simulations. This distribution is verified with 1000 simulations based on the Monte-Carlo probabilistic approach.
Keywords
Monte Carlo methods; finite element analysis; integrated circuit packaging; FFEM method; IC package material; Monte Carlo approach; Monte Carlo probabilistic approach; design uncertainty; die stress; fuzzy finite element modelling; overmould material property; package warpage; reflow temperature; thermomechanical stress; Abstracts; Correlation; Iron;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
Conference_Location
Wroclaw
Print_ISBN
978-1-4673-6138-5
Type
conf
DOI
10.1109/EuroSimE.2013.6529924
Filename
6529924
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