DocumentCode :
606915
Title :
Vibration durability of board mounted BallGridArrays
Author :
Hauck, T. ; Schmadlak, I.
Author_Institution :
Freescale Semicond., München, Germany
fYear :
2013
fDate :
14-17 April 2013
Firstpage :
1
Lastpage :
4
Abstract :
The reliability of electrical components and their solder joints in particular, with respect to vibration, also often referred to as high cycle fatigue, becomes more and more important to customers in the automotive industry. The industry increasingly requires a guaranteed life time of the solder joints considering a defined vibration load by means of modeling and simulation due to shorter time to market cycles for electronic control units and therefore less allowance for failure during product qualification. The paper presents an accepted and efficient procedure to calculate the solder joint life time, considering a given random vibration profile for a MAPBGA and discusses its possibilities and limits. A stress-life durability model is used to estimate the reliability of board level assemblies. It is based on a combination of Basquin´s law for high cycle fatigue (HCF) and Coffin-Manson law for low cycle fatigue.
Keywords :
ball grid arrays; reliability; solders; vibrations; Basquin´s law; Coffin-Manson law; MAPBGA; board level assemblies reliability; board mounted ball grid arrays; electrical components reliability; electronic control units; high cycle fatigue; low cycle fatigue; solder joints; stress-life durability model; vibration durability; Abstracts; Electric shock; Industries; Safety; Shape; Silicon; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-1-4673-6138-5
Type :
conf
DOI :
10.1109/EuroSimE.2013.6529976
Filename :
6529976
Link To Document :
بازگشت