Analytical element coupled to finite elements for simulation of probe movement in non destructive testing

The work involves the simulation of the movement of the sensor used for nondestructive testing of conductive parts. The simulation is performed by the implementation of a coupling model between finite element and analytical solutions in 2D case. The analytical solution is determined in the region corresponding to lift-off (the space between the sensor and the test piece). Other regions of the domain are discretized by finite elements.