• DocumentCode
    607788
  • Title

    Digital-to-analog converter effects on orthogonal frequency division multiplexing performance

  • Author

    Ozdag, C. ; Uye, T.K.K. ; Uye, G.K.K. ; Salarvan, A.

  • Author_Institution
    Elektron. ve Haberlesme Muhendisligi Bolumu, Istanbul Teknik Univ., İstanbul, Turkey
  • fYear
    2013
  • fDate
    24-26 April 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The effects of digital-to-analog converter (DAC) static errors on orthogonal frequency division multiplexing (OFDM) system performance are investigated. A behavioral model of an OFDM block that exists in a Long Term Evolution (LTE) system architecture is combined with a behavioral model of a transmit DAC typically found in an LTE signal chain. The effects of DAC non-idealities such as resolution, gain error, and integral non-linearity (INL) are correlated to OFDM system performance parameters such as error vector magnitude (EVM) and bit error rate (BER). MATLAB simulations show that DAC non-idealities can cause up to 25% normalized EVM and up to 5 dB BER increase at 30 dB energy per bit to noise power spectral density ratio (Eb/N0).
  • Keywords
    Long Term Evolution; OFDM modulation; digital-analogue conversion; error statistics; telecommunication power management; BER; DAC nonidealities; DAC static error; EVM; INL; LTE signal chain; LTE system architecture; Long Term Evolution; MATLAB simulation; OFDM block; OFDM system performance parameter; behavioral model; bit error rate; digital-to-analog converter effect; error vector magnitude; gain error; integral nonlinearity; orthogonal frequency division multiplexing performance; power spectral density ratio; Bit error rate; Blogs; Digital-analog conversion; Long Term Evolution; Mathematical model; OFDM; Quadrature amplitude modulation; BER; DAC; EVM; INL; LTE; OFDM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Communications Applications Conference (SIU), 2013 21st
  • Conference_Location
    Haspolat
  • Print_ISBN
    978-1-4673-5562-9
  • Electronic_ISBN
    978-1-4673-5561-2
  • Type

    conf

  • DOI
    10.1109/SIU.2013.6531449
  • Filename
    6531449