DocumentCode :
608166
Title :
Highly stable low noise / high power AlN/GaN-on-silicon double heterostructure HEMTs operating at 40 GHz
Author :
Medjdoub, F. ; Tagro, Y. ; Grimbert, Bertrand ; Ducatteau, Damien ; Rolland, Nathalie ; Silvestri, Riccardo ; Meneghini, Matteo ; Zanoni, Enrico ; Meneghesso, Gaudenzio
Author_Institution :
IEMN, Villeneuve-d´Ascq, France
fYear :
2013
fDate :
14-18 April 2013
Abstract :
In this paper, an emerging double heterostructure high electron mobility transistor (DHFET) based on AlN/GaN/AlGaN grown on silicon substrate is presented. This configuration system allowed state-of-the-art GaN-on-silicon DC, RF output power and noise performances at 40 GHz, paving the way for high performance mmW cost-effective amplifiers. Preliminary reliability assessment has been performed on this new class of RF devices, showing promising mmW GaN-on-Si device stability for the first time.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; millimetre wave amplifiers; millimetre wave transistors; power HEMT; silicon; wide band gap semiconductors; AlN-GaN-AlGaN; DHFET; RF devices; Si; device stability; double heterostructure high electron mobility transistor; frequency 40 GHz; high performance mmW cost-effective amplifiers; highly stable low noise high power-on-silicon double heterostructure HEMT; Current measurement; III-V semiconductor materials; Leakage currents; Logic gates; Performance evaluation; Radio frequency; Stress; formatting; insert; style; styling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2013.6531985
Filename :
6531985
Link To Document :
بازگشت