Title :
Open localization on copper wirebond using Space Domain Reflectometry
Author :
Gaudestad, J. ; Talanov, V.V. ; Orozco, Alvaro ; Khai Ling Khoo
Author_Institution :
Neocera, LLC, Beltsville, MD, USA
Abstract :
Space Domain Reflectometry (SDR) is a new technique that has already shown to be a reliable non-destructive method to image open failures in semiconductor chips by pumping a high frequency signal into the open trace. We show in this paper that SDR can be used to accurately find a breakage location in copper wire bond that failed during stress test.
Keywords :
copper; lead bonding; reflectometry; semiconductor device reliability; SDR; breakage location; copper wirebond reliability; high frequency signal; image open failures; nondestructive method; open localization; open trace; semiconductor chips; space domain reflectometry; stress test; Magnetic fields; Magnetic sensors; Radio frequency; Reflectometry; SQUIDs; Wires; SDR; magnetic current imaging; non-destructive; open;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2013.6532024
