• DocumentCode
    608264
  • Title

    Models and methods for determining storage reliability

  • Author

    Mense, A.T. ; Gullo, L. ; Thomas, Julian ; Shedlock, P.

  • Author_Institution
    Raytheon Missile Syst., Tucson, AZ, USA
  • fYear
    2013
  • fDate
    14-18 April 2013
  • Abstract
    Current dormant storage reliability prediction methods are out dated and may not represent current technology. Some customers are concerned the data supporting the storage reliability prediction method are too old and not reflective of the current technology capability. This paper provides an approach and documents the results of an ongoing case study that uses a binary logistic regression (BLR) model (both classical and Bayesian) to assess recent system failures during non-operating storage and non-operating transportation. Both non-operational and operational system failures were considered in the analysis to determine presence of wear-out mechanisms and degradation, which may cause operational failures. As described in IEEE Std 1413 [1], the usefulness of a reliability prediction is based on how the prediction is developed and how well the prediction is prepared, interpreted, and applied. Reliability predictions are affected by the accuracy and completeness of the information provided to perform the prediction and the methods used to complete the prediction. The benefit of the BLR model is that it provides consistent and repeatable results that provide increased customer confidence in products.
  • Keywords
    Bayes methods; failure analysis; integrated circuit reliability; regression analysis; BLR model; Bayesian system; IEEE Std 1413; binary logistic regression; dormant storage reliability; nonoperating storage; nonoperating transportation; nonoperational system; storage reliability prediction; wear-out mechanisms; Analytical models; Data models; Degradation; Logistics; Predictive models; Reliability engineering; Binary Logistic Regression (BLR); FRACAS; Storage Reliability; field data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4799-0112-8
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2013.6532083
  • Filename
    6532083