Contributions of charge sharing and bipolar effects to cause or suppress MCUs on redundant latches

There are two of main factors, charge sharing and bipolar effects to cause or suppress SEUs and MCUs. Technology scaling increases the the role of bipolar effects with respect to multiple bit upsets. We analyze contributions of charge sharing and bipolar effects by changing the position of well contacts and the well structure. Device simulation results reveal that charge sharing and bipolar effect are suppressed effectively when the well contacts are placed in the middle of two latches.