DocumentCode :
608331
Title :
UTP cable length measuring instrument feturing TI´s interface circuits
Author :
Kjosev, J. ; Cvetkovski, D. ; Popovikj, A.
Author_Institution :
Fac. of Electr. Eng., SS Cyril & Methodius Univ., Skopje, Macedonia
fYear :
2012
fDate :
13-14 Sept. 2012
Firstpage :
109
Lastpage :
113
Abstract :
Time Domain Reflectometry (TDR) diagnostic features of Ethernet physical transceiver chips are explored for evaluating their applicability for construction of an UTP-cable length-measurement and diagnostic instrument. The instrument is mainly intended as an aid during installation and for post-installation documentation. Dithering method is applied for length measurement to increase the resolution, based on physical patch-cable switchover and/or discrete component cable emulation and/or programmable delay-line delay-dithering. A practical experiment with length dithering using cable patches confirms the feasibility of the idea.
Keywords :
time-domain reflectometry; transceivers; twisted pair cables; Ethernet physical transceiver chips; UTP cable length; UTP-cable length-measurement; cable patches; diagnostic instrument; discrete component cable emulation; dithering method; interface circuits; physical patch-cable switchover; post-installation documentation; time domain reflectometry diagnostic features;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Education and Research Conference (EDERC), 2012 5th European DSP
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-4595-8
Electronic_ISBN :
978-1-4673-4595-8
Type :
conf
DOI :
10.1109/EDERC.2012.6532236
Filename :
6532236
Link To Document :
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