DocumentCode :
609704
Title :
A practical NoC design for parallel DES computation
Author :
Yuan, Ruyi ; Ruan, Shuang-chen ; Gotze, Joachim
Author_Institution :
Low-Power Syst. Lab., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2013
fDate :
22-24 April 2013
Firstpage :
1
Lastpage :
4
Abstract :
The Network-on-Chip (NoC) is considered to be a new SoC paradigm for the next generation to support a large number of processing cores. The idea to combine NoC with homogeneous processors constructing a Multi-Core NoC (MCNoC) is one way to achieve high computational throughput for specific purpose like cryptography. Many researches use cryptography standards for performance demonstration but rarely discuss a suitable NoC for such standard. The goal of this paper is to present a practical methodology without complicated virtual channel or pipeline technologies to provide high throughput Data Encryption Standard (DES) computation on FPGA. The results point out that a mesh-based NoC with packet and Processing Element (PE) design according to DES specification can achieve great performance over previous works. Moreover, the deterministic XY routing algorithm shows its competitiveness in high throughput NoC and the West-First routing offers the best performance among Turn-Model routings, representatives of adaptive routing.
Keywords :
cryptography; field programmable gate arrays; integrated circuit design; multiprocessing systems; network routing; network-on-chip; FPGA; MCNoC; PE design; SoC paradigm; adaptive routing; cryptography standards; data encryption standard computation; deterministic XY routing algorithm; high computational throughput; homogeneous processors; mesh-based NoC; multicore NoC; network-on-chip design; packet design; parallel DES computation; performance demonstration; processing element design; turn-model routings; west-first routing; Algorithm design and analysis; Computer architecture; Cryptography; Noise measurement; Program processors; Routing; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-4435-7
Type :
conf
DOI :
10.1109/VLDI-DAT.2013.6533881
Filename :
6533881
Link To Document :
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