• DocumentCode
    609744
  • Title

    Fault diagnosis in diode clamped multilevel inverter drive using wavelet transforms

  • Author

    Vinothkumar, V. ; Muniraj, C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., K.S. Rangasamy Coll. of Technol., Thiruchengode, India
  • fYear
    2013
  • fDate
    14-15 March 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Induction motors are normally used in the industrial environments. Industry has begun to use energy efficient high power rating electrical drives. Multilevel inverter drives have become a solution for energy efficient drives in recent years. There may be probability for occurring of many faults in the multi-level inverter fed induction motor drive due to its complex switching patterns. So it is necessary to identify types of fault and its location in order to improve the reliability of the drives. In this paper presents a new fault diagnosis technique based on discrete wavelet transforms for diode clamped multilevel inverter fed induction motor drives. For demonstrating the proposed method the gate pulse failure fault are considered in the diode clamped multilevel inverter. The complete system is modeled using MATLAB/Simulink. The simulated results are shown to illustrate the effectiveness of the proposed method.
  • Keywords
    diodes; discrete wavelet transforms; failure analysis; fault diagnosis; induction motor drives; invertors; reliability; Matlab-Simulink; complex switching patterns; diode clamped multilevel inverter fed induction motor drives; discrete wavelet transforms; energy efficient high power rating electrical drives; fault diagnosis technique; gate pulse failure fault; multilevel inverter drives; reliability; Circuit faults; Discrete wavelet transforms; Feature extraction; Induction motors; Inverters; Logic gates; Torque; discrete wavelet transforms; induction motor; multi-level inverter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green High Performance Computing (ICGHPC), 2013 IEEE International Conference on
  • Conference_Location
    Nagercoil
  • Print_ISBN
    978-1-4673-2592-9
  • Type

    conf

  • DOI
    10.1109/ICGHPC.2013.6533925
  • Filename
    6533925