• DocumentCode
    610278
  • Title

    Invited tutorial: MEMS: Driving advances in electronic devices

  • Author

    Groothuis, S.

  • Author_Institution
    Micron Technol., Inc., Boise, ID, USA
  • fYear
    2013
  • fDate
    12-12 April 2013
  • Abstract
    The goal of the course is to give you a brief overview of MEMS technologies by covering packaging, reliability, simulation, and testing. We will venture into recent developments like Sensor Fusion, Integrated CMOS-MEMS, and BioMEMS. You will gain an in-depth knowledge of challenges and opportunities associated with bringing MEMS-based products to market through the course´s focus on two key topics: (1) MEMS Packaging - You will learn packaging concepts for MEMS devices while reviewing assembly and packaging procedures such as structural release, cleaning, encapsulation, and testing. The tutorial will also cover various challenges associated with packaging and testing MEMS. (2) MEMS Reliability - This tutorial will review MEMS reliability issues and associated analysis/simulation techniques. MEMS reliability requires a broad understanding of physics, material science, and mechanics in order to handle the challenges during research, development, and productization.
  • Keywords
    CMOS integrated circuits; assembling; integrated circuit reliability; integrated circuit testing; micromechanical devices; packaging; sensor fusion; MEMS packaging; MEMS reliability; MEMS testing; analysis technique; assembly procedure; bioMEMS; electronic device; integrated CMOS-MEMS; material science; mechanics; packaging procedure; physics; sensor fusion; simulation technique; structural releasing; Abstracts; Micromechanical devices; Reliability; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices (WMED), 2013 IEEE Workshop on
  • Conference_Location
    Boise, ID
  • ISSN
    1947-3834
  • Print_ISBN
    978-1-4673-6034-0
  • Type

    conf

  • DOI
    10.1109/WMED.2013.6544496
  • Filename
    6544496