DocumentCode
610278
Title
Invited tutorial: MEMS: Driving advances in electronic devices
Author
Groothuis, S.
Author_Institution
Micron Technol., Inc., Boise, ID, USA
fYear
2013
fDate
12-12 April 2013
Abstract
The goal of the course is to give you a brief overview of MEMS technologies by covering packaging, reliability, simulation, and testing. We will venture into recent developments like Sensor Fusion, Integrated CMOS-MEMS, and BioMEMS. You will gain an in-depth knowledge of challenges and opportunities associated with bringing MEMS-based products to market through the course´s focus on two key topics: (1) MEMS Packaging - You will learn packaging concepts for MEMS devices while reviewing assembly and packaging procedures such as structural release, cleaning, encapsulation, and testing. The tutorial will also cover various challenges associated with packaging and testing MEMS. (2) MEMS Reliability - This tutorial will review MEMS reliability issues and associated analysis/simulation techniques. MEMS reliability requires a broad understanding of physics, material science, and mechanics in order to handle the challenges during research, development, and productization.
Keywords
CMOS integrated circuits; assembling; integrated circuit reliability; integrated circuit testing; micromechanical devices; packaging; sensor fusion; MEMS packaging; MEMS reliability; MEMS testing; analysis technique; assembly procedure; bioMEMS; electronic device; integrated CMOS-MEMS; material science; mechanics; packaging procedure; physics; sensor fusion; simulation technique; structural releasing; Abstracts; Micromechanical devices; Reliability; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and Electron Devices (WMED), 2013 IEEE Workshop on
Conference_Location
Boise, ID
ISSN
1947-3834
Print_ISBN
978-1-4673-6034-0
Type
conf
DOI
10.1109/WMED.2013.6544496
Filename
6544496
Link To Document