DocumentCode :
610315
Title :
Cleaning uncertain data for top-k queries
Author :
Luyi Mo ; Cheng, Russell ; Xiang Li ; Cheung, David Wai-lok ; Yang, Xiaoping S.
Author_Institution :
Dept. of Comput. Sci., Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
8-12 April 2013
Firstpage :
134
Lastpage :
145
Abstract :
The information managed in emerging applications, such as sensor networks, location-based services, and data integration, is inherently imprecise. To handle data uncertainty, probabilistic databases have been recently developed. In this paper, we study how to quantify the ambiguity of answers returned by a probabilistic top-k query. We develop efficient algorithms to compute the quality of this query under the possible world semantics. We further address the cleaning of a probabilistic database, in order to improve top-k query quality. Cleaning involves the reduction of ambiguity associated with the database entities. For example, the uncertainty of a temperature value acquired from a sensor can be reduced, or cleaned, by requesting its newest value from the sensor. While this “cleaning operation” may produce a better query result, it may involve a cost and fail. We investigate the problem of selecting entities to be cleaned under a limited budget. Particularly, we propose an optimal solution and several heuristics. Experiments show that the greedy algorithm is efficient and close to optimal.
Keywords :
data integration; query processing; cleaning operation; data integration; data uncertainty handling; location-based services; optimal solution; probabilistic databases; probabilistic top-k query; sensor networks; temperature value uncertainty; top-k queries; top-k query quality; uncertain data cleaning; world semantics; Cleaning; Motion pictures; Probabilistic logic; Query processing; Semantics; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Engineering (ICDE), 2013 IEEE 29th International Conference on
Conference_Location :
Brisbane, QLD
ISSN :
1063-6382
Print_ISBN :
978-1-4673-4909-3
Electronic_ISBN :
1063-6382
Type :
conf
DOI :
10.1109/ICDE.2013.6544820
Filename :
6544820
Link To Document :
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