CMOS image sensor technology development for system-level optimization

Author

Wang, Cheng C. ; Hsu, T.H. ; Ting, S.F. ; Cheng, H.Y. ; Chen, C.Y. ; Chiang, W.C. ; Liu, J.C. ; Wuu, S.G.

Author_Institution

R&D Dept., Taiwan Semicond. Manuf. Co., Ltd., Tainan, Taiwan

fYear

2013

fDate

22-24 April 2013

Firstpage

1

Lastpage

2

Abstract

A modern CMOS image sensor (CIS) is not only a high-precision, high-dynamic-range, mix-signal electronic device, the system design also requires an integrated consideration on optical imaging function. As pixel size continues to scale down, pixel performance needs to be maintained at an equivalent level to avoid overall image quality degradation. This paper describes several system-level properties such as quantum efficiency, noise performance, and crosstalk under illumination of a tilted incident angle.

Keywords

CMOS image sensors; integrated circuit noise; CMOS image sensor technology; crosstalk under illumination; image quality; noise performance; optical imaging function; quantum efficiency; system-level optimization; tilted incident angle; Arrays; CMOS image sensors; Noise; Optical crosstalk; Optical filters; Optical imaging; Optical sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications (VLSI-TSA), 2013 International Symposium on

Conference_Location

Hsinchu

Print_ISBN

978-1-4673-3081-7

Electronic_ISBN

978-1-4673-6422-5

Type

conf

DOI

10.1109/VLSI-TSA.2013.6545643

Filename

6545643