Title :
CMOS image sensor technology development for system-level optimization
Author :
Wang, Cheng C. ; Hsu, T.H. ; Ting, S.F. ; Cheng, H.Y. ; Chen, C.Y. ; Chiang, W.C. ; Liu, J.C. ; Wuu, S.G.
Author_Institution :
R&D Dept., Taiwan Semicond. Manuf. Co., Ltd., Tainan, Taiwan
Abstract :
A modern CMOS image sensor (CIS) is not only a high-precision, high-dynamic-range, mix-signal electronic device, the system design also requires an integrated consideration on optical imaging function. As pixel size continues to scale down, pixel performance needs to be maintained at an equivalent level to avoid overall image quality degradation. This paper describes several system-level properties such as quantum efficiency, noise performance, and crosstalk under illumination of a tilted incident angle.
Keywords :
CMOS image sensors; integrated circuit noise; CMOS image sensor technology; crosstalk under illumination; image quality; noise performance; optical imaging function; quantum efficiency; system-level optimization; tilted incident angle; Arrays; CMOS image sensors; Noise; Optical crosstalk; Optical filters; Optical imaging; Optical sensors;
Conference_Titel :
VLSI Technology, Systems, and Applications (VLSI-TSA), 2013 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-3081-7
Electronic_ISBN :
978-1-4673-6422-5
DOI :
10.1109/VLSI-TSA.2013.6545643
