DocumentCode :
6108
Title :
A Variation Tolerant Current-Mode Signaling Scheme for On-Chip Interconnects
Author :
Dave, Mayank ; Jain, Manan ; Shojaei Baghini, Maryam ; Sharma, Divya
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. (IIT) Bombay, Mumbai, India
Volume :
21
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
342
Lastpage :
353
Abstract :
Current-mode signaling (CMS) with dynamic overdriving is one of the most promising scheme for high-speed low-power communication over long on-chip interconnects. However, they are sensitive to parameter variations due to reduced voltage swings on the line. In this paper, we propose a variation tolerant dynamic overdriving CMS scheme. The proposed CMS scheme and a competing CMS scheme (CMS-Fb) are fabricated in 180-nm CMOS technology. Measurement results show that the proposed scheme offers 34% reduction in energy/bit and 42% reduction in energy-delay-product over CMS-Fb scheme for a 10 mm line operating at 0.64 Gbps of data rate. Simulations indicate that the proposed CMS scheme consumes 0.297 pJ/bit for data transfer over the 10 mm line at 2.63 Gb/s. Measurements indicate that the delay of CMS-Fb becomes 2.5 times its nominal value in the presence of intra-die variations whereas the delay of the proposed scheme changes by only 5% for the same amount of intra-die variations. Measurement and simulation results show that both the schemes are robust against inter-die variations. Experiments and simulations also indicate that the proposed CMS scheme is more robust against practical variations in supply and temperature as compared to CMS-Fb scheme.
Keywords :
CMOS integrated circuits; delay tolerant networks; integrated circuit interconnections; CMOS technology; CMS-Fb; bit rate 0.64 Gbit/s; bit rate 2.63 Gbit/s; data transfer; dynamic overdriving; energy-delay-product reduction; high-speed low-power communication; intra die variation; on-chip interconnects; parameter variations; size 10 mm; size 180 nm; variation tolerant current-mode signaling scheme; variation tolerant dynamic overdriving CMS scheme; voltage swing reduction; Delay; Integrated circuit interconnections; Inverters; Receivers; Robustness; Transistors; Transmitters; Current-mode circuit; dynamic overdriving; on-chip global interconnects; process variation;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2185835
Filename :
6165684
Link To Document :
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