DocumentCode
61125
Title
Developing a Rework Process for Underfilled Electronics Components via Integration of TRIZ and Cluster Analysis
Author
Chien-Yi Huang ; Yueh-Hsun Lin ; Pei-Fang Tsai
Author_Institution
Nat. Taipei Univ. of Technol., Taipei, Taiwan
Volume
5
Issue
3
fYear
2015
fDate
Mar-15
Firstpage
422
Lastpage
438
Abstract
This paper integrates the theory of inventive problem solving and cluster analysis to develop effective rework processes for underfilled electronic components. First, the function analysis is used to clarify the functional disadvantages such as underfill material attaching to the component, the printed circuit board (PCB), and the solder joints during the rework process. The cause-effect contradiction chain analysis then helps to identify engineering contradictions. Second, this research proposes clustered contradiction matrix. The optimal number of clusters for the inventive principles is determined by Ward´s method of hierarchical approach. The K-means method is then used to allocate the engineering parameters to the appropriate cluster to achieve superior clustering performance. The priority of inventive principles considered as solution triggers is based on their corresponding frequency of appearances. Three solutions focused laser beam to remove electronics component, dispensable component bracket, and interchangeable PCB are proposed to rework the underfilled electronics components. Finally, the idealities of solutions are assessed and the most ideal solution interchangeable PCB is nominated for the U.S. patent.
Keywords
cause-effect analysis; functional analysis; laser beam applications; pattern clustering; printed circuit manufacture; problem solving; solders; statistical analysis; K-means method; TRIZ; U.S. patent; Ward´s method; cause-effect contradiction chain analysis; cluster analysis; clustered contradiction matrix; function analysis; interchangeable PCB; laser beam; printed circuit board; rework process; solder joints; theory of inventive problem solving; underfill material; underfilled electronics components; Electronic components; Heating; Packaging; Soldering; Substrates; Transmission line matrix methods; Cluster analysis; rework process; theory of inventive problem solving (TRIZ); underfilled component; underfilled component.;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2015.2394388
Filename
7038160
Link To Document