Title :
Modeling and Experimental Study of the Kink Formation Process in Wire Bonding
Author :
Fuliang Wang ; Yun Chen ; Lei Han
Author_Institution :
State Key Lab. of High Performance Complex Manuf., Central South Univ., Changsha, China
Abstract :
Looping is a key technology for the modern wire bonder. A kink is a critical structure in a wire loop. In order to understand the kink formation mechanism, a 2-D dynamic finite element model is developed using ANSYS/LS-DYNA, in which the air tension force, friction between capillary and wire, and real capillary trace are considered. The simulated kink formation process was verified by an experiment. With this model, the strain distribution on a gold wire was calculated, and the effects of wire material properties and capillary trace parameters on the kink number, position, and loop profiles were studied. Simulation results show that a minute average plastic strain of 0.14 is needed to form a distinct kink in a wire. Similarly, an elastic core with an average plastic strain of less than 0.08 at the center of a kink provides stiffness and sag/sway resistance for loops. A kink is a wire segment with plastic deformation outside and an elastic core inside, and the number of kinks and their positions are mainly affected by the capillary trace. In contrast, wire material properties only slightly influence the kink properties. This paper may provide helpful insights into loop design for modern microelectronics packages.
Keywords :
finite element analysis; integrated circuit packaging; lead bonding; tape automated bonding; 2D dynamic finite element model; ANSYS-LS-DYNA; air tension force; elastic core; gold wire; kink formation process; kink loop profiles; kink number; kink position; microelectronics packages; plastic strain; real capillary trace parameter; sag-sway resistance; strain distribution; wire bonding; wire loop; wire material property; Atmospheric modeling; Finite element methods; Gold; Plastics; Strain; Stress; Wires; Finite element (FE) model; kink formation; looping; strain distribution; thermosonic wire bonding;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2012.2225649