DocumentCode :
612
Title :
A Closed-Form Charge Control Model for the Threshold Voltage of Depletion- and Enhancement-Mode AlGaN/GaN Devices
Author :
Wang, Zhen ; Zhang, Boming ; Chen, Weijie ; Li, Zuyi
Author_Institution :
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronics Science and Technology of China, Chengdu, China
Volume :
60
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1607
Lastpage :
1612
Abstract :
A closed-form charge control model (CCM) for threshold voltage (V_{\\rm th}) of single-heterojunction (AlGaN/GaN) devices is developed. The CCM reveals the mechanisms of how the space charges across the barrier of a heterojunction deplete or enhance 2-D electron gas. The V_{\\rm th} of both depletion- and enhancement-mode heterostructure field-effect transistors may be calculated through this model. Considering the strained and relaxed states, and surface states, the calculated results for V_{\\rm th} are in good agreement with simulation results. The generalized form for CCM may have wide applications for theoretical-based design for V_{\\rm th} of AlGaN/GaN devices.
Keywords :
Aerospace electronics; Aluminum gallium nitride; Gallium nitride; HEMTs; Heterojunctions; Space charge; Threshold voltage; AlGaN/GaN; charge control model (CCM); heterostructure field effect transistor (HFET); threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2252466
Filename :
6490040
Link To Document :
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