• DocumentCode
    612198
  • Title

    Design of a FinFET based inverter using MTCMOS and SVL leakage reduction technique

  • Author

    Manorama ; Khandelwal, Sourabh ; Akashe, Shyam

  • Author_Institution
    Electron. & Commun. Eng. Dept., ITM Univ., Gwalior, India
  • fYear
    2013
  • fDate
    12-14 April 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Scaling of the Standard single-gate bulk MOSFETs faces great challenges in the nanometer regime due to the severe short-channel effects that cause an exponential increase in the leakage current and enhanced sensitivity to process variations. Double-gate FinFET has better SCEs performance compared to the conventional CMOS and stimulates technology scaling because of the self-alignment of the two gates. In this paper, we describe different mode of FinFET technology and performed the comparative analysis of stand-by leakage (when the circuit is idle), delay and the total power of the logic circuit, on Cadence Virtuoso tool at 45nm By applying MTCMOS and SVL are effective circuit-level techniques and that provides a high performance and low power design by utilizing both low and high-threshold voltage transistor. The leakage power of the FinFETs based inverter using SVL technique is 50-60% lower than the normal FinFETs based inverter and the total power consumption of FinFETs based inverter using MTCMOS technique is 65-70% lower than the normal FinFETs based inverter.
  • Keywords
    CMOS logic circuits; MOSFET; integrated circuit design; invertors; leakage currents; low-power electronics; nanoelectronics; threshold logic; Cadence Virtuoso tool; FinFET based inverter design; FinFET technology; MTCMOS; SCE performance; SVL; circuit-level technique; delay; double-gate FinFET; gate self-alignment; high-threshold voltage transistor; leakage power; leakage reduction technique; logic circuit; low power design; low-threshold voltage transistor; nanometer regime; process variation; sensitivity; short-channel effect; single-gate bulk MOSFET; size 45 nm; stand-by leakage; total power; FinFETs; Inverters; Leakage currents; Logic gates; Power demand; FinFETs; High-performance; Independent gate (IG) mode; Low power (LP) mode; Short channel effects (SCEs); Shorted gate (SG) mode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering and Systems (SCES), 2013 Students Conference on
  • Conference_Location
    Allahabad
  • Print_ISBN
    978-1-4673-5628-2
  • Type

    conf

  • DOI
    10.1109/SCES.2013.6547489
  • Filename
    6547489