Foreword

Welcome to VTS 2013, the thirty first in a series of annual symposia that focus on innovation in the field of testing of integrated circuits and systems. The core of VTS 2013, the three-day technical program, responds to the many trends and challenges in the semiconductor design and manufacturing industries, with papers covering a diverse and seminal set of topics including: analog, mixed-signal & RF test; ATPG and compression; BIST; delay and performance test; diagnosis & debug; design for testability; defect, fault and error tolerance; power issues & noise; design verification & security; memory test & repair; on-line test, diagnosis & characterization test of high-speed I/Os; and 3D ICs. In addition to the three-day paper sessions, VTS 2013 features several special sessions including a panel, two new topic sessions, two student activity sessions and two embedded tutorials. VTS 2013 continues the tradition of featuring the Innovative Practices track. The sessions that make up this track highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.