DocumentCode :
612983
Title :
Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters
Author :
Jae Woong Jeong ; Ozev, Sule ; Sen, Satyaki ; Mak, T.M.
Author_Institution :
Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2013
fDate :
April 29 2013-May 2 2013
Firstpage :
1
Lastpage :
6
Abstract :
Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, the difference in architecture results in differences in potential circuit impairments/fault models, leading to different test/measurement/calibration requirements. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create inter modulation distortion that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Therefore, measurement and compensation/calibration of these parameters are important to ensure proper operation for the polar transmitter. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth based on the measurement of the 3rd order inter modulation distortion (IMD3) at the output of the transmitter. First, a two-tone input at a sufficiently low frequency is applied to the transmitter baseband input to calculate the delay. Then, we apply another two-tone input at a relatively higher frequency to determine the envelope bandwidth. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately within 10ms which is negligible compared to signal source switching and settling times.
Keywords :
calibration; intermodulation distortion; phase measurement; radio transmitters; 3rd order intermodulation distortion; Cartesian transmitters; EVM requirements; IMD3; calibration requirements; circuit impairments; envelope path bandwidth; envelope-phase path delay skew measurement; error vector magnitude requirements; fault models; finite envelope bandwidth; measurement requirements; phase signals; polar transmitters; portable devices; power efficiency; settling times; signal source switching; spectral mask requirements; test requirements; time 10 ms; transmitter baseband input; two-tone input; Bandwidth; Baseband; Delays; Distortion measurement; Intermodulation distortion; Modulation; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
978-1-4673-5542-1
Type :
conf
DOI :
10.1109/VTS.2013.6548888
Filename :
6548888
Link To Document :
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